A Test Sequence Generation Method Based on Dependencies and Slices

Abstract

Based on the incorrect test results caused by dependencies in the execution of test cases, this paper proposes a method to optimize test sequence. Extract the dependencies to construct the dependence loop set, separate with iteration method in the maximum loop-cutting way to obtain a test case slice without dependence loops, and repeat the above step to get all the test case slices. For the test case slice set, get the node dependence value of each test case and sort the values in a descending order to generate the test sequence. The algorithm analysis and experimental results show that compared with the optimization techniques considering dependencies, this method reduces the number of resetting of database.