Analysis and Test of Time Difference Measurement IP Based on FIB

Abstract

With the development of semiconductor technology, how to locate and verify the problems found in chip testing becomes the key of the chip design. In the test of time difference measurement IP chip, test results find that the phase shift output does not correspond with the design requirements. After analyzing the circuit, the leakage current of refresh circuit is found. The FIB (Focused Ion Beam) technology is adopted to modify the physical circuit. The circuit is tested after FIB. The result shows that the judgement and analysis of the crux of the problem is correct. Through FIB, not only the problem is found, but also the function and performance of the chip are tested rapidly. The purpose of rapid verification is achieved, and the modification time is saved. Using FIB can help to reduce the cost of chip design sometimes.