ET-based Test Data Generation for Multiple-path Testing

Abstract

Automatic test data generation for path testing is one of the difficult problems of software testing And the existing methods have low efficiency and stability. We have conducted studies on the research field about ET-based test data generation for multiple-path testing, and we have improved the efficiency and the stability of the method by improved the fitness function of currently existing method. By the comparison experiments, it showed that the method in this paper have high efficiency and stability. Meanwhile, we gave the conclusion how the basic parameters impacted on the efficiency, and suggested the setting range of parameters.